Webinars

Semiconductor testing involves numerous parameters, complex interactions, and constraints, making comprehensive testing costly and time-consuming. Across device characterization, process development, reliability testing, and wafer-level validation, engineers need efficient ways to explore large test spaces. SmartUQ offers advanced Design of Experiments (DOE) and subsampling tools to address these challenges. For device characterization, process development, and reliability testing, SmartUQ's modern DOEs efficiently explore parameters such as voltage, temperature, frequency, and process settings while respecting test constraints. For wafer-level testing and device qualification, SmartUQ's subsampling methods identify the most informative subset from thousands of potential test conditions. SmartUQ also builds accurate machine learning (ML) models from test data to predict outcomes at untested conditions, identify key performance drivers, and reveal complex parameter relationships. Join this webinar to discover how SmartUQ's DOE, subsampling, and ML capabilities reduce testing time and cost, accelerate semiconductor development, and maximize the value of test data.